-------- Weitergeleitete Nachricht -------- Betreff: [InternetTC] TOTJ Special Issue on Tools, Techniques, and Applications for Fault Tolerant and Reliable Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV) Datum: Sat, 31 May 2025 14:14:23 -0400 Von: Al-Sakib Khan Pathan sakib.pathan@GMAIL.COM An: itc@COMSOC.ORG

[Apologies, if you receive multiple copies of this CFP]

***Call for Papers***

Special Issue on:

Tools, Techniques, and Applications for Fault Tolerant and Reliable Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV) Journal: The Open Transportation Journal

Journal URL: https://www.sciencedirect.com/org/journal/the-open-transportation-journal CFP link: https://www.eurekaselect.com/call-for-papers-detail/6299/specialissue

Paper submission DEADLINE: 31 December, 2025

** Papers will be handled as they arrive **

Guest Editor Team

Al-Sakib Khan Pathan, PhD (Lead Guest Editor) United International University, Bangladesh sakib.pathan@gmail.com

Riaz Ahmed Shaikh, PhD University of East Anglia, UK Riaz-Ahmed.Shaikh@uea.ac.uk

Mohiuddin Ahmed, PhD Edith Cowan University, Australia mohiuddin.ahmed@ecu.edu.au

Theme/Aims and Scope of the Special Issue

While numerous research works have been done on various topics of Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV), the issues related to fault tolerance and reliability need more efficient and pragmatic solutions. Fault in VANET and IoV can be caused mainly due to hardware failure or software bug or malfunction. In plain terms, fault can be defined as an error (or, irregular activity) that causes such a network to work erroneously or renders it not to provide the expected service. Again, fault tolerance is the characteristic that allows the network to operate at least at a satisfactory level so that some of the services can still be provided even after the occurrence of an error or fault. Reliability is related to this in the sense that a faultless or fault tolerant system can be preferable to be relied upon. In the existing literature, there are some sporadic efforts for addressing fault tolerance and reliability issues in VANET and IoV, and the focus is often given explicitly on security, energy-efficiency, and so on. While those other issues are somewhat intertwined with the concept of fault and reliability, and often, they impact each other directly, in this special issue (SI), we are interested in a special focus on the fault tolerant and reliable mechanisms, especially connectivity developed for VANET and IoV. There are in fact a number of tools, techniques and applications that have somewhat addressed this area in general but we hope that a special issue will offer a good platform for the researchers to publish the most recent advancements and trends in this focus area. Topics for this SI include, but are not limited to: - Fault tolerance ensuring tools and techniques in VANET/IoV - Applications of fault tolerant VANET/IoV - Ensuring reliability of VANET/IoV - Fault detection and correction mechanisms for VANET/IoV - Performance impact under faulty condition in VANET/IoV - Reliability and trust in VANET/IoV - Connectivity assurance in VANET/IoV

Important Dates

Paper submission: 31 December, 2025 Notification of Acceptance/Rejection/Revision: 30 March, 2026 Publication: TBA

Submission Instructions:

Please submit your manuscript via the online submission portal of the journal on the link provided below using the thematic issue code: "BMS-TOTJ-2024-HT-18" or explicitly mention the SI title in the cover letter during submission via:

https://bentham.manuscriptpoint.com/journals/totj

For general guidelines for paper preparation and other author instructions, kindly visit ("FOR AUTHORS" menu): https://www.sciencedirect.com/org/journal/the-open-transportation-journal

++ For any query, you may directly write to the GEs.

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Regards, Sakib Lead Guest Editor

-- Al-Sakib Khan Pathan, Ph.D., SMIEEE Editor-in-Chief: International Journal of Computers and Applications, Taylor & Francis, UK Editor-in-Chief: Journal of Cyber Security Technology, Taylor & Francis, UK Associate Editor: Intl Journal of Computational Science and Engineering, Inderscience Editor: ICT Express, Elsevier ; AHSWN, Old City Pub, USA ; IJSNet, Inderscience All My Books: https://sites.google.com/site/spathansite/books

Professor, Department of Computer Science and Engineering United International University (UIU), Dhaka, Bangladesh Email: sakib.pathan@gmail.com, spathan@ieee.org URL: https://sites.google.com/site/spathansite/

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